This unit is used to measure crystal wafers semi-automatically. It was developed based on our

DX-4A unit. To meet different requirement of customers two types of unit ,DX-9 and DX-10 are designed.

In DX-9 unit the diffractive peak is searched automatically but the wafer handling including moving and sorting is operated manually. In DX-9A unit the diffractive peak searching and wafer handling are made automatically after that the wafer is put in the wafer holder by hand.

The unit is controlled with a computer board，driven by a stepping motor and operated with a key board. It is a convenient and economical unit.

Specification

Input power supply :         Single phase AC 220V,50Hz,0.5Kw.

X-ray tube :                         Cu target, air cooling with fan.

Tube rate, max.:                  30kV,5mA.

Detector :                            Geiger counter.

Wafer shape:                      rectangle

Sorting rate :                       1500-2000 pcs/h.

Repeatability :                     ±5".

Sorting box :                         0, ±1, ±2, ±3, ±4, ±out, total 11 boxes

Angle range/box :              15", 30", 60".

Minimum reading:             1".